Aetheria/tests
Repository files (latest commit first)
Filename Latest commit message Latest commit date
Meta Vens 293747c5f9 ConsumableSupplyTests: pin the generator's Random after generation to the pre-consumable tree
The gated-versus-plain comparison alone cannot see an unconditional draw (both catalogs draw).
Values measured on origin/master d4a27def with the same fixture. The roll-before-availability
mutant survived the full suite without this pin.

Co-Authored-By: Claude Opus 5.5 <noreply@anthropic.com>
2026-10-10 07:57:32 +02:00
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Aetheria.Shared.Tests ConsumableSupplyTests: pin the generator's Random after generation to the pre-consumable tree 2026-10-10 07:57:32 +02:00
mutation_tests_addressables_cut.py Move every LonginusX consumer to the Longinus: scenarios, tests, tools, the starting hull 2026-10-08 13:44:48 +02:00
mutation_tests_shield_panel_cut1.py Add the Cut 1 batchmode probe and its mutation harness 2026-09-18 06:08:24 +02:00
mutation_tests_shield_panel_cut2.py Fix ShieldManager's missing-envelope fallback regression 2026-09-18 06:45:07 +02:00
mutation_tests_shield_panel_cut3.py Add the Cut 3 batchmode probe and its mutation harness 2026-09-18 13:51:44 +02:00