Commit graph Aetheria/tests/Aetheria.Shared.Tests/InspectionScannerCatalogTests.cs
Author SHA1 Message Date
Meta Vens
d23038f53c Assembly is the maker's: re-land of h1 on 0f5def17 (net diff of ae300c6a..5187a59d)
Applies the net diff of eureka/aetheria-release-assembly-from-maker (5187a59d) without its catalog blob and RunStartTests residue, git apply -3, overlaps resolved on master's side. 066fb581's message ('git log --oneline -1') was a heredoc slip; the old branch stays as it is. Drops the Rarity = fixture member from the tests master added since ae300c6a. Faction keys 19-20 here are h1's; the next commit reshapes them to one Assembly at 19.

Co-Authored-By: Claude Opus 5.5 <noreply@anthropic.com>
2026-10-17 18:55:16 +02:00
Meta Vens
2a69c40bfa Tests: layout-aim behaviour, retarget scan progress, Inspection Scanner role map, Entity-free fixture assertion
Co-Authored-By: Claude Opus 5.5 <noreply@anthropic.com>
2026-10-15 00:17:21 +02:00
Meta Vens
283d1365c4 Tests: inspection scanner catalog, command, schematic gear rows; scanner/emission/stance residuals
InspectionScannerCatalogTests and InspectionScannerCommandTests (new); AFinishedScanListsTheGearOnTheSchematic; AScanReadsNoHostility pins pace, emit and a target-side sensor; AScanTakesTheSamePathForAnyPilot uses a Minion in CombatState; an emission heard within Range over the lot's alpha (ping and scan); the docked-subject test is a Theory over true and false; a ReveEal formatting probe. Not yet run: may not build.

Co-Authored-By: Claude Opus 5.5 <noreply@anthropic.com>
2026-10-14 21:19:14 +02:00